发布网友 发布时间:2022-10-15 20:46
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热心网友 时间:2023-10-11 22:50
Since 1990, people began to pay attention to the semiconctor electron field emission, in the beginning, "Diamond Field Emission age." then further expand to the DLC cold cathode material. Currently III-nitrides and II-VI group, for example, and other wide-bandgap semiconctor has become a hot field emission materials. These materials have excellent chemical and thermal stability, high melting point, high thermal conctivity, high breakdown voltage and large carrier mobility rate especially the smaller electron affinity and potential or even a negative electron affinity, and the situation has greatly reced the market launch of the threshold voltage, therefore, Field emission of such material will have a very vast potential for development and application prospects. Ultra High Vacuum Field Emission Testing System fired presence has a very important role. Currently Field Emission Laboratory tests are all designed to create the system, the absence of certain norms and standards, There are different levels of defects and deficiencies. Based on the field emission testing laboratory, there are still some obvious shortcomings, The paper focuses on the room's field emission instrument Improvement and Design : First, Based on the piezoelectric ceramic micro-approximation system of understanding, the use of piezoelectric stepper motor systems, design, Manufacturing Field Emission Testing System rough adjustment Step System to improve the current tests used by the precision and stability is not good vacuum field emission devices rough one-dimensional positioning reconcile system, through piezoelectric stepper motor control the accuracy of the improved and reconcile a small peacekeeping positioning systems. They also use a range grating feedback system with piezoelectric horse stepping closed-loop system composed of anode control system. In addition, analysis of samples anode plate and between parallel approximation problem. Anode plate because the presence of the launch film on the Performance Test Application has been our hope, Therefore the design and proction of "anode plate-sample" approximation system is the general trend. However anode plate with the parallel issue of the sample is a great obstacle. "anode plate-sample" parallel approach to improve the system design. Today's electronic control technology is so advanced, the design of the whole control process, Build an electronic control testing software will be necessary to improve the testing links, finally, To enhance the current equipment used by the measurement precision must change control practices, on the whole testing process of the control of the main ideas.